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dc.contributor.authorLópez Ríos, Sonia Yaneth-
dc.contributor.authorPorras Montenegro, Nelson-
dc.contributor.authorDuque Echeverri, Carlos Alberto-
dc.date.accessioned2016-10-07T23:12:32Z-
dc.date.available2016-10-07T23:12:32Z-
dc.date.issued2003-
dc.identifier.citationLópez Ríos, S. Y., Porras-Montenegro, N., & Duque, C. A. (2003). Binding energy and density of shallow impurity states in GaAs–(Ga, Al)As quantum wells: effects of an applied hydrostatic stress. Semiconductor Science and Technology, 18(7), 718-722.spa
dc.identifier.issn0268-1242-
dc.identifier.urihttp://hdl.handle.net/10495/4866-
dc.description.abstractABSTRACT: The effects of hydrostatic stress on the binding energy and the density of shallow-donor and shallow-acceptor impurity states in a GaAs–(Ga, Al)As quantum well are calculated using a variational procedure within the effective-mass approximation. Results are for different well widths and hydrostatic stresses, as a function of the impurity position along the growth direction of the structure. We have found that in the low-pressure regime the binding energy changes linearly for both donor and acceptor impurities, independently of the sizes of the well. However, for high pressures (greater than 13.5 kbar) this is valid for acceptors but not for donors due to the -X crossover. We have shown that there are two special structures in the density of impurity states, one associated with on-centre and the other with on-edge impurities. Also, we have observed that the density of impurity states depends strongly on the applied hydrostatic stress.spa
dc.format.mimetypeapplication/pdfspa
dc.language.isoengspa
dc.publisherInstitute of Physics Publishing Ltd.spa
dc.type.hasversioninfo:eu-repo/semantics/publishedVersionspa
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 Colombia*
dc.rightsinfo:eu-repo/semantics/openAccessspa
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/co/*
dc.titleBinding energy and density of shallow impurity states in GaAs–(Ga, Al)As quantum wells : effects of an applied hydrostatic stressspa
dc.typeinfo:eu-repo/semantics/articlespa
dc.publisher.groupGrupo de Educación en Ciencias Experimentales y Matemáticas (GECEM)spa
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85spa
dc.rights.accessrightshttp://purl.org/coar/access_right/c_abf2spa
dc.identifier.eissn1361-6641-
oaire.citationtitleSemiconductor Science and Technologyspa
oaire.citationstartpage718spa
oaire.citationendpage722spa
oaire.citationvolume18spa
oaire.citationissue7spa
dc.rights.creativecommonshttps://creativecommons.org/licenses/by-nc-nd/4.0/spa
dc.type.coarhttp://purl.org/coar/resource_type/c_2df8fbb1spa
dc.type.redcolhttps://purl.org/redcol/resource_type/ARTspa
dc.type.localArtículo de investigaciónspa
dc.subject.decsHidrostática-
dc.subject.decsHydrostatics-
dc.subject.lembPozos cuánticos-
dc.subject.lembQuantum wells-
dc.subject.lembEnergía de enlace-
dc.subject.lembBinding energy-
dc.subject.proposalAguas poco profundasspa
dc.subject.proposalImpurezas en GaAs-
dc.subject.proposalEstres hidrostáticospa
dc.subject.proposalDensidad de estadosspa
dc.subject.proposalMasa efectivaspa
dc.relation.ispartofjournalabbrevSemicond. Sci. Technol.spa
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