Por favor, use este identificador para citar o enlazar este ítem: https://hdl.handle.net/10495/36082
Título : Quantification of coverage, uniformity and residues for CVD monolayer graphene transfer process based on image analysis
Autor : Ballestas Romero, Kevin Manuel
Zapata Caro, Juan Diego
Ramírez Zora, Daniel Estiben
metadata.dc.subject.*: Microscopía
Microscopy
Imágenes
Images
Grafeno
Graphene
Análisis de imágenes
Image analysis
http://aims.fao.org/aos/agrovoc/c_458424fb
http://aims.fao.org/aos/agrovoc/c_36762
Fecha de publicación : 2023
Editorial : Elsevier
Resumen : ABSTRACT: The use of CVD-grown graphene requires a transfer method to transport this material from the metal foil on top of which it is grown onto a target substrate. In many cases this transfer changes its properties, leading to variations from one zone of the target substrate to another. Here we present a simple semi-automatic method for a quantitative study of the coverage, uniformity and residues of graphene transferred onto Si/SiO2 substrates whose operation is not dependent on costly equipment, making it low-cost oriented. The method can be extrapolated to different target substrates, e.g., ITO-coated glass, and serves as an evaluation tool for graphene transfer processes. This is achieved by calculating a figure of merit, based on 2 proposed quantitative parameters (accounting for the coverage and the uniformity of the transferred graphene), while simultaneously determining the residues left by the transfer substrate using MATLAB-based image analysis of optical microscopy images. To corroborate the proposed method, a comparison between polydimethylsiloxane (PDMS), thermal release tape (TRT) and polymethylmethacrylate- (PMMA) assisted transfer processes is performed, demonstrating that the methodology is valid for all cases. Coverages over 80 % are obtained, being in good agreement with results from the same transfer processes studied via Raman mapping.
metadata.dc.identifier.eissn: 1873-5584
ISSN : 0169-4332
metadata.dc.identifier.doi: 10.1016/j.apsusc.2023.158074
Aparece en las colecciones: Artículos de Revista en Ingeniería

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