Por favor, use este identificador para citar o enlazar este ítem: https://hdl.handle.net/10495/8365
Título : Feshbach projection approach to study plasma effects on doubly excited autoionizing states in helium
Autor : Ordóñez Lasso, Andrés Felipe
Cardona Gómez, Juan Carlos
Sanz Vicario, José Luis
metadata.dc.subject.*: Efectos del plasma
Electrónica cuántica
Quantum electronics
Resonancia
Resonance
Partículas
Particulates
Efecto Feshbach
Resonancia (energías y tiempos de vida)
http://aims.fao.org/aos/agrovoc/c_2e3bd581
Fecha de publicación : 2013
Editorial : The American Physical Society
Citación : Ordóñez Lasso, A. F., Cardona, J. C., & Sanz Vicario, J. L. (2013). Feshbach projection approach to study plasma effects on doubly excited autoionizing states in helium. Physical Review A. 88(012702), 1-12.
Resumen : ABSTRACT: We have implemented a method based on the Feshbach formalism along with an explicitly correlated configuration interactionmethod to perform a systematic study on the behavior of resonance parameters (energies and lifetimes) of the autoionizing states of plasma-embedded He 1,3Se, 1,3Po, and 1,3De, as a function of the screening strength. In particular, we study the evolution of the lowest states in the series located below the He+(N = 2) ionization threshold in the unscreened case. At variance with one-electron atoms (where shape resonance widths vary monotonically with the screening strength) the evolution of the Auger width with respect to screening is found to be different for each series represented by (K,T )A pseudoquantum numbers until resonances merge into the upper electronic continuum, when crossing the He+(2s) threshold. We conclude from our ab initio calculations that, although resonances pertaining to the same (K,T )A series share a similar tendency in their widths against the screening strength, general propensity rules for the robustness of lifetimes, based on the isomorphic series in the (K,T )A classification, cannot be established in plasma embedded helium.
metadata.dc.identifier.eissn: 1050-2947
ISSN : 1094-1622
metadata.dc.identifier.doi: 10.1103/PhysRevA.88.012702
Aparece en las colecciones: Artículos de Revista en Ciencias Exactas y Naturales

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